Beckhoff BGR-022365-A000824B-DED | High-Density DIB Module

  • Model: BGR-022365-A000824B-DED
  • Brand: Beckhoff
  • Core Function: Precision Device Interface Board (DIB) for high-density signal routing and conditioning in semiconductor testing.
  • Availability: In Stock, Lead Time Applies
  • Warranty: 12-Month Warranty, Fully Tested
  • Our Advantage: Expert technical support, pre-sale compatibility verification
Category: SKU: Beckhoff BGR-022365-A000824B-DED
Phone: +86 15383419322
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Description

Key Technical Specifications

  • Model Number: BGR-022365-A000824B-DED
  • Manufacturer: Beckhoff
  • Product Type: Device Interface Board (DIB)
  • Max Channels: 1024 (expandable via stacking)
  • Contact Resistance: <0.5Ω per channel
  • Frequency Range: DC to 70 GHz
  • Data Rate: 12.8 Gbps (NRZ) / 25.6 Gbps (PAM4)
  • Insertion Loss: <0.3 dB/mm @ 40 GHz
  • Thermal Stability: ±0.5°C (with active cooling)
  • Substrate Material: Rogers 4350B / Arlon AD410

Functional Role & Application Analysis

The Beckhoff BGR-022365-A000824B-DED is a precision Device Interface Board (DIB) designed for high-performance semiconductor test systems. It solves the critical problem of maintaining signal integrity at extreme data rates and frequencies. By providing nanoscale measurement accuracy, it ensures reliable testing for complex chips like 5G RFICs, AI accelerators, and automotive MCUs.

Typical use cases include:

  • Wafer-level and final test applications requiring high-density I/O routing.
  • Multi-site parallel testing with active thermal compensation.
  • RF and mmWave testing up to 70 GHz with proprietary loss compensation.

 

Our Quality Standard & Testing Process

We understand that the cost of an unreliable part is far greater than its purchase price. We have established a rigorous, multi-stage testing process to ensure every product we ship is 100% functional.

  • Visual & Component Inspection: All parts undergo professional cleaning and visual inspection to ensure no physical damage, corrosion, or compromised components.
  • Live System Test: The module is installed in a live test rack and run for 24 hours to verify continuous operation and communication.
  • Full-Function Diagnostics: We simulate high-speed signals to test the full range and accuracy of every single channel.
  • Warranty Backing: Only parts that pass all diagnostic tests are approved for shipment and backed by our full 12-month warranty.
Beckhoff BGR-022365-A000824B-DED

Beckhoff BGR-022365-A000824B-DED

Compatibility & Migration Paths

To ensure this BGR-022365-A000824B-DED is 100% compatible with your system, you must check these key compatibility points. Failure to verify this is a common project risk.

  • Firmware/Hardware Revisions: You must confirm your existing ATE (Automated Test Equipment) system supports the specific DIB revision. Earlier versions may not recognize this module.
  • Required Components: This module must be used with compatible contactor interfaces (Pogo pin / MEMS socket). Verify your socket type before ordering.
  • Replacement & Alternatives: This model is designed for specific high-frequency applications. If your application requires lower data rates, you may also consider standard DIB models as a cost-effective alternative.
  • Get Expert Help: Unsure about your system? Contact our technical team today for a free compatibility check.